The paper analyzes the applicability of methods for estimating the parameters of the VLSI sensitivity by single radiation effects (SEE) using focused laser radiation of picosecond duration in order to expand their application for submicron VLSI. A comparison of ionization track structure from a heavy charged particle and the ionization region of a semiconductor structure under focused... https://pxvjnjuaqmju.blog-kids.com/35131064/novel-antibiofilm-chemotherapies-target-nitrogen-from-glutamate-and-glutamine